Andrea Scorzoni was born in Bologna, Italy, in 1958. He received the Electronic Engineering degree in 1983 and the Ph.D. degree in 1989 from the University of Bologna.

Since 1983 he has been working on various contracts in Bologna at the Laboratory of Chemistry and Technology of Materials for Electronics (LAMEL), an Institute of the Italian National Council of Research (CNR). His area of interest includes ohmic contact resistivity measurements and modeling for VLSI applications, electromigration phenomena, reliability and degradation mechanisms of semiconductor devices, solid-state, silicon-based, radiation sensors and, in general, electrical measurements and solid-state electron devices.

In 1988 he became a Research Associate at the CNR-LAMEL and in 1989 he was scientific responsible of the ESPRIT-SPECTRE (Stategic Project for European cmos Technology Research and Exploitation) European scientific programme for his Institute, contributing to a research on rapid test methods for the evaluation of electromigration susceptibility.

In 1991 he was part of a group whose main task was the design and qualification of a CMOS process. In particular, his interest was devoted to the photolitographic processes and to the definition and use of the test structures for the electrical characterization of the process quality.

From 1992 to 1997 he was responsible of the CNR-LAMEL electromigration team in the framework of the ESPRIT-ADEQUAT (Advanced DEvelopment for QUArter micron cmos Technology) European programme, working mainly on high resolution resistometric methods for electromigration evaluation.

From 1996 to 1998 he focused his attention on the standardization of test structures and methods to characterize electromigration, in the frame of the SMT-PROPHECY (PROcedures for the early PHase evaluation of reliability of Electronic Components bY development of CECC rules) European programme.

Since 1998 he is Associated Professor of Electronics at the Department of Electronic and Information Engineering (DIEI), University of Perugia. He is presently the Italian Coordinator of a subtask of the Italian Project MADESS 2 on "Test structures and test procedures for the reliability assessment of a multilevel interconnect ULSI technology with minimum feature size of 0.18 micron".

Prof. Scorzoni has authored and coauthored about 50 technical papers related to the above fields, a number review papers on contact resistivity measurements and on electromigration in thin metal lines.

Speaking of hobbies, Andrea Scorzoni is active in the Digital Model Railroading scenario, pursuing the dream of "compatibility above all" among the different digital systems presently available. Finally, he likes to play hard bop with his tenor saxophone.